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MNT235: Semiconductor Metrology and Quality Control – 3 credits

Introduces fundamental principles of metrology and quality control systems in manufacturing environments. Covers measurement science, statistical process control, inspection methodologies, measurement system analysis, and failure analysis techniques. Emphasis on yield optimization, measurement uncertainty, calibration procedures, and implementation of quality control protocols. Prepares students for quality technician and metrology specialist positions in advanced manufacturing facilities. Prerequisites: None.

Class# Location Delivery Dates Days Times Instructors Availability
34134
Rio Salado
Online Class
Hybrid In-Person : You can start on any Monday between dates:
10/19 – 10/19
Fall 2026
N/A
N/A
  • J. Hyder II
Open
2 of 3 seats available
  • Eight (8) Week Class
    No textbook is required for the course. All materials will be provided free of charge through RioLearn.
    Software required for the course: Microsoft Word or similar word processing software
    Open Educational Resources (OER) are learning, teaching, and research materials in any format and medium that reside in the public domain or have an open license copyright that permits no-cost access, re-use, re-purpose, retention, redistribution, and adaptation by others.
    Zero-Textbook-Cost Class: The total cost of required online instructional materials for this "Z Class" is $0.
  • No books listed at the bookstore, contact instructor